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	Analysis of grounding resistance reduction effect based on enhancing impulse current leakage efficiency
	Yuan, Tao[1]; Lei, Chaoping[1]; Sima, Wenxia[1]; Yang, Qing[1]; Luo, Ling[1]; Ai, Linfeng[1]
	2012
卷号	27页码:278-284
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3047598
专题	重庆大学
推荐引用方式 GB/T 7714	Yuan, Tao[1],Lei, Chaoping[1],Sima, Wenxia[1],et al. Analysis of grounding resistance reduction effect based on enhancing impulse current leakage efficiency[J],2012,27:278-284.
APA	Yuan, Tao[1],Lei, Chaoping[1],Sima, Wenxia[1],Yang, Qing[1],Luo, Ling[1],&Ai, Linfeng[1].(2012).Analysis of grounding resistance reduction effect based on enhancing impulse current leakage efficiency.,27,278-284.
MLA	Yuan, Tao[1],et al."Analysis of grounding resistance reduction effect based on enhancing impulse current leakage efficiency".27(2012):278-284.

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