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	Electrical and optical characterization of AgxO films deposited by RF reactive magnetron sputtering
	Zhao, Xiaolong; He, Yongning; Peng, Wenbo; Chen, Liang
刊名	THIN SOLID FILMS
	2017
卷号	636页码:333-338
关键词	Optical properties AgxO films Defects Electrical properties X-ray detector Band gap
ISSN号	0040-6090
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2949929
专题	西安交通大学
推荐引用方式 GB/T 7714	Zhao, Xiaolong,He, Yongning,Peng, Wenbo,et al. Electrical and optical characterization of AgxO films deposited by RF reactive magnetron sputtering[J]. THIN SOLID FILMS,2017,636:333-338.
APA	Zhao, Xiaolong,He, Yongning,Peng, Wenbo,&Chen, Liang.(2017).Electrical and optical characterization of AgxO films deposited by RF reactive magnetron sputtering.THIN SOLID FILMS,636,333-338.
MLA	Zhao, Xiaolong,et al."Electrical and optical characterization of AgxO films deposited by RF reactive magnetron sputtering".THIN SOLID FILMS 636(2017):333-338.

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