| Performance deterioration of p-type single crystalline silicon solar modules affectedby potential induced degradation in photovoltaic power plant | |
| Yang, Hong; Wang, Fumei; Wang, He; Chang, Jipeng; Song, Dengyuan; Su, Chengfeng | |
| 刊名 | MICROELECTRONICS RELIABILITY
 |
| 2017 | |
| 卷号 | 72页码:18-23 |
| 关键词 | PV power plant Substring PID Crystalline solar modules |
| ISSN号 | 0026-2714 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2947650 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Yang, Hong,Wang, Fumei,Wang, He,et al. Performance deterioration of p-type single crystalline silicon solar modules affectedby potential induced degradation in photovoltaic power plant[J]. MICROELECTRONICS RELIABILITY,2017,72:18-23. |
| APA | Yang, Hong,Wang, Fumei,Wang, He,Chang, Jipeng,Song, Dengyuan,&Su, Chengfeng.(2017).Performance deterioration of p-type single crystalline silicon solar modules affectedby potential induced degradation in photovoltaic power plant.MICROELECTRONICS RELIABILITY,72,18-23. |
| MLA | Yang, Hong,et al."Performance deterioration of p-type single crystalline silicon solar modules affectedby potential induced degradation in photovoltaic power plant".MICROELECTRONICS RELIABILITY 72(2017):18-23. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论