Defect Distribution Prognosis of High Voltage Circuit Breakers with Enhanced Latent Dirichlet Allocation | |
Guo, Cheng; Li, Gaoyang; Zhang, Haojun; Ju, Xiaotao; Zhang, Yongqiang; Wang, Xiaohua | |
2017 | |
关键词 | Bayesian method circuit breaker defect distribution latent Dirichlet allocation |
页码 | 466-472 |
会议录 | 2017 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-HARBIN) |
URL标识 | 查看原文 |
ISSN号 | 2166-5656 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2941302 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Guo, Cheng,Li, Gaoyang,Zhang, Haojun,et al. Defect Distribution Prognosis of High Voltage Circuit Breakers with Enhanced Latent Dirichlet Allocation[C]. 见:. |
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