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Defect Distribution Prognosis of High Voltage Circuit Breakers with Enhanced Latent Dirichlet Allocation
Guo, Cheng; Li, Gaoyang; Zhang, Haojun; Ju, Xiaotao; Zhang, Yongqiang; Wang, Xiaohua
2017
关键词Bayesian method circuit breaker defect distribution latent Dirichlet allocation
页码466-472
会议录2017 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-HARBIN)
URL标识查看原文
ISSN号2166-5656
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/2941302
专题西安交通大学
推荐引用方式
GB/T 7714
Guo, Cheng,Li, Gaoyang,Zhang, Haojun,et al. Defect Distribution Prognosis of High Voltage Circuit Breakers with Enhanced Latent Dirichlet Allocation[C]. 见:.
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