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	Effect of the post-annealing temperature on the thermal-decomposed NiOx hole contact layer for perovskite solar cells
	Guo, Yuxiao; Yin, Xingtian; Liu, Jie; Chen, Wei; Wen, Sen; Que, Meidan; Tian, Yapeng; Yang, Yawei; Que, Wenxiu
刊名	Journal of Advanced Dielectrics
	2018
卷号	8
关键词	Annealing temperature Hole transport layer NiOx Perovskite solar cell Thermally decomposing
ISSN号	2010-1368
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2922282
专题	西安交通大学
推荐引用方式 GB/T 7714	Guo, Yuxiao,Yin, Xingtian,Liu, Jie,et al. Effect of the post-annealing temperature on the thermal-decomposed NiOx hole contact layer for perovskite solar cells[J]. Journal of Advanced Dielectrics,2018,8.
APA	Guo, Yuxiao.,Yin, Xingtian.,Liu, Jie.,Chen, Wei.,Wen, Sen.,...&Que, Wenxiu.(2018).Effect of the post-annealing temperature on the thermal-decomposed NiOx hole contact layer for perovskite solar cells.Journal of Advanced Dielectrics,8.
MLA	Guo, Yuxiao,et al."Effect of the post-annealing temperature on the thermal-decomposed NiOx hole contact layer for perovskite solar cells".Journal of Advanced Dielectrics 8(2018).

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