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	Critical radius phenomenon and mechanism for SF6 gaps under very fast transient and lightning impulse voltages
	Zhang, Lu; Wu, Jingfeng; Wang, Sen; Sun, Lei; Zhang, Qiaogen
刊名	IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING
	2018
卷号	13页码:367-372
关键词	VFTO space charge SF6 gas gap critical radius streamer leader
ISSN号	1931-4973
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2919406
专题	西安交通大学
推荐引用方式 GB/T 7714	Zhang, Lu,Wu, Jingfeng,Wang, Sen,et al. Critical radius phenomenon and mechanism for SF6 gaps under very fast transient and lightning impulse voltages[J]. IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING,2018,13:367-372.
APA	Zhang, Lu,Wu, Jingfeng,Wang, Sen,Sun, Lei,&Zhang, Qiaogen.(2018).Critical radius phenomenon and mechanism for SF6 gaps under very fast transient and lightning impulse voltages.IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING,13,367-372.
MLA	Zhang, Lu,et al."Critical radius phenomenon and mechanism for SF6 gaps under very fast transient and lightning impulse voltages".IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING 13(2018):367-372.

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