| Locating the Centre Line of Paddle Vats for Cutting Wafer Images by Using Binary Segmentation | |
| Pan, Nengyuan; Liu, Rong; Wang, Meiqing | |
| 2010 | |
| 关键词 | threshold paddle vat detection wafer dicing binarization density histogram |
| 页码 | 561-564 |
| 会议录 | PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON DISTRIBUTED COMPUTING AND APPLICATIONS TO BUSINESS, ENGINEERING AND SCIENCE (DCABES 2010)
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| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2907001 |
| 专题 | 福州大学 |
| 推荐引用方式 GB/T 7714 | Pan, Nengyuan,Liu, Rong,Wang, Meiqing. Locating the Centre Line of Paddle Vats for Cutting Wafer Images by Using Binary Segmentation[C]. 见:. |
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