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A new precise positioning method for piezoelectric scanner of AFM.
Wang, Y.a; Wu, S.b; Xu, L.b; Zeng, Y.c
刊名Ultramicroscopy
2019
卷号Vol.196页码:67-73
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2897648
专题天津大学
作者单位1.aTianjin Key Laboratory of Information Sensing and Intelligent Control, Tianjin University of Technology and Education, Tianjin, 300222, China
2.bState Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, 300072, China
3.cCollege of Engineering and Technology, Tianjin Agricultural University, Tianjin, 300380, China
推荐引用方式
GB/T 7714
Wang, Y.a,Wu, S.b,Xu, L.b,et al. A new precise positioning method for piezoelectric scanner of AFM.[J]. Ultramicroscopy,2019,Vol.196:67-73.
APA Wang, Y.a,Wu, S.b,Xu, L.b,&Zeng, Y.c.(2019).A new precise positioning method for piezoelectric scanner of AFM..Ultramicroscopy,Vol.196,67-73.
MLA Wang, Y.a,et al."A new precise positioning method for piezoelectric scanner of AFM.".Ultramicroscopy Vol.196(2019):67-73.
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