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	Experimental Study of Capillary Effect in Porous Silicon UsingMicro-Raman Spectroscopy and X-Ray Diffraction
	Lei, Z.-K.a; Kang, Y.-L.a; Qiu, Y.a; Hu, M.b; Cen, H.a
刊名	Chinese Physics Letters
	2004
卷号	Vol.21 No.7
ISSN号	0256-307X
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2890831
专题	天津大学
作者单位	1.aDepartment of Mechanics, School of Mechanical Engineering, Tianjin University, Tianjin 300072, China 2.bDept. of Electron. Sci./Technology, Sch. of Electron. Info. Engineering, Tianjin University, Tianjin 300072, China
推荐引用方式 GB/T 7714	Lei, Z.-K.a,Kang, Y.-L.a,Qiu, Y.a,et al. Experimental Study of Capillary Effect in Porous Silicon UsingMicro-Raman Spectroscopy and X-Ray Diffraction[J]. Chinese Physics Letters,2004,Vol.21 No.7.
APA	Lei, Z.-K.a,Kang, Y.-L.a,Qiu, Y.a,Hu, M.b,&Cen, H.a.(2004).Experimental Study of Capillary Effect in Porous Silicon UsingMicro-Raman Spectroscopy and X-Ray Diffraction.Chinese Physics Letters,Vol.21 No.7.
MLA	Lei, Z.-K.a,et al."Experimental Study of Capillary Effect in Porous Silicon UsingMicro-Raman Spectroscopy and X-Ray Diffraction".Chinese Physics Letters Vol.21 No.7(2004).

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