ALD Al2O3 passivation of Lg=100 nm metamorphic InAlAs/InGaAs HEMTs with Si-doped Schottky layers on GaAs substrates | |
Wang SK(王盛凯); Chang HD(常虎东); Sun B(孙兵); Liu HG(刘洪刚); Niu JB(牛洁斌) | |
刊名 | solid state electronics
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2017-10-06 | |
文献子类 | 期刊论文 |
内容类型 | 期刊论文 |
源URL | [http://159.226.55.106/handle/172511/18010] ![]() |
专题 | 微电子研究所_高频高压器件与集成研发中心 |
推荐引用方式 GB/T 7714 | Wang SK,Chang HD,Sun B,et al. ALD Al2O3 passivation of Lg=100 nm metamorphic InAlAs/InGaAs HEMTs with Si-doped Schottky layers on GaAs substrates[J]. solid state electronics,2017. |
APA | 王盛凯,常虎东,孙兵,刘洪刚,&牛洁斌.(2017).ALD Al2O3 passivation of Lg=100 nm metamorphic InAlAs/InGaAs HEMTs with Si-doped Schottky layers on GaAs substrates.solid state electronics. |
MLA | 王盛凯,et al."ALD Al2O3 passivation of Lg=100 nm metamorphic InAlAs/InGaAs HEMTs with Si-doped Schottky layers on GaAs substrates".solid state electronics (2017). |
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