Formation of monolayer graphene on a basal HOPG surface irradiated with Xe ions
Zhao, Y. T.1; Cheng, R.1; Lu, X.2; Peng, H. B.2; Wang, T. S.2; Yang, K. J.2; Yuan, W.2; Wang, Q.2
2013-07-15
关键词Highly charged ion Graphene HOPG Raman spectroscopy
卷号307
DOI10.1016/j.nimb.2012.12.075
页码127-130
英文摘要Highly charged Xeq+ (q = 5, 21, 26) ions with kinetic energy of 450 keV were extracted from electron cyclotron resonance ion source. Highly oriented pyrolytic graphite (HOPG) basal surfaces were impacted by the Xeq+ ions. The samples were analyzed with Raman spectroscopy. There appeared a tiny peak in Raman spectrum at position of 2643 cm(-1) for the impact of Xe5+ ion, which suggested the monolayer graphene was formed on the HOPG surface. The intensity of the peak depended on the charge state of incident ions. (C) 2013 Elsevier B.V. All rights reserved.
会议录NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版者ELSEVIER SCIENCE BV
会议录出版地PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
语种英语
WOS研究方向Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
WOS记录号WOS:000321722200030
内容类型会议论文
源URL[http://119.78.100.186/handle/113462/58316]  
专题近代物理研究所_实验物理中心
通讯作者Peng, H. B.
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Zhao, Y. T.,Cheng, R.,Lu, X.,et al. Formation of monolayer graphene on a basal HOPG surface irradiated with Xe ions[C]. 见:.
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