Formation of monolayer graphene on a basal HOPG surface irradiated with Xe ions | |
Zhao, Y. T.1; Cheng, R.1; Lu, X.2; Peng, H. B.2; Wang, T. S.2; Yang, K. J.2; Yuan, W.2; Wang, Q.2 | |
2013-07-15 | |
关键词 | Highly charged ion Graphene HOPG Raman spectroscopy |
卷号 | 307 |
DOI | 10.1016/j.nimb.2012.12.075 |
页码 | 127-130 |
英文摘要 | Highly charged Xeq+ (q = 5, 21, 26) ions with kinetic energy of 450 keV were extracted from electron cyclotron resonance ion source. Highly oriented pyrolytic graphite (HOPG) basal surfaces were impacted by the Xeq+ ions. The samples were analyzed with Raman spectroscopy. There appeared a tiny peak in Raman spectrum at position of 2643 cm(-1) for the impact of Xe5+ ion, which suggested the monolayer graphene was formed on the HOPG surface. The intensity of the peak depended on the charge state of incident ions. (C) 2013 Elsevier B.V. All rights reserved. |
会议录 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS |
会议录出版者 | ELSEVIER SCIENCE BV |
会议录出版地 | PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
语种 | 英语 |
WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
WOS记录号 | WOS:000321722200030 |
内容类型 | 会议论文 |
源URL | [http://119.78.100.186/handle/113462/58316] |
专题 | 近代物理研究所_实验物理中心 |
通讯作者 | Peng, H. B. |
作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China |
推荐引用方式 GB/T 7714 | Zhao, Y. T.,Cheng, R.,Lu, X.,et al. Formation of monolayer graphene on a basal HOPG surface irradiated with Xe ions[C]. 见:. |
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