The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures

doi:10.1049/cje.2016.08.016

	The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures
	Li Pengwei 1; Wang Wenyan 1; Luo Lei 1; Yu Qingkui 1; Tang Min 1; Du Feipeng 2; Liu Jie 3
刊名	CHINESE JOURNAL OF ELECTRONICS
	2016-11
卷号	25 页码:1097-1100
关键词	DC/DC converter Single event function failure Sensitive factors Topological structure
ISSN号	1022-4653
DOI	10.1049/cje.2016.08.016
英文摘要	Heavy ion radiation experiments have been done to DC/DC converters with different topological structures for space applications. The test results were analyzed about the function failure of three topological structures caused by single event effects. The relationship between the function failure and the input supply voltage, the output load current and the topological structure of the module were discussed. Based on the analysis of the variation relationship among the source/drain terminal voltage of MOSFETs and the input voltage and the output load, the sensitivity factors associated with the function failure caused by single event effects were discussed. A new analysis on single event function failure of DC/DC converter based on different topologies has been presented, which can be applied to radiation hardened design and space application.
WOS研究方向	Engineering
语种	英语
出版者	TECHNOLOGY EXCHANGE LIMITED HONG KONG
WOS记录号	WOS:000387735900016
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/56628]
专题	中国科学院近代物理研究所
通讯作者	Li Pengwei
作者单位	1.China Acad Space Technol, Beijing 100029, Peoples R China 2.East China Inst Microelect Technol, Hefei 230088, Peoples R China 3.Chinese Acad Sci, Lanzhou Inst Modern Phys, Lanzhou 730000, Peoples R China
推荐引用方式 GB/T 7714	Li Pengwei,Wang Wenyan,Luo Lei,et al. The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures[J]. CHINESE JOURNAL OF ELECTRONICS,2016,25:1097-1100.
APA	Li Pengwei.,Wang Wenyan.,Luo Lei.,Yu Qingkui.,Tang Min.,...&Liu Jie.(2016).The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures.CHINESE JOURNAL OF ELECTRONICS,25,1097-1100.
MLA	Li Pengwei,et al."The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures".CHINESE JOURNAL OF ELECTRONICS 25(2016):1097-1100.