Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 angstrom

doi:10.1063/1.4982798

	Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 angstrom
	Tu, B.1,2; Li, M. C.1,2; Lu, Q. F.1,2; Zhao, Z. Z.1,2; Shen, Y.1,2; Yang, Y.1,2; Lu, D.1,2; Yao, K.1,2; Chen, C. Y.1,2; Zhou, H. J.3
刊名	AIP ADVANCES
	2017-04-01
卷号	7 页码:7
ISSN号	2158-3226
DOI	10.1063/1.4982798
英文摘要	We reported the relative responsivity calibration of the grazing-incidence flat-field EUV spectrometer between 175 and 435 angstrom by means of two methods. The first method is implemented by measuring the diffraction efficiency of the grating with synchrotron radiation light source. Considering the transmission efficiency and quantum efficiency of the other optical components in the spectrometer, the total responsivity was then obtained. The second one was carried out by measuring line emissions from C3+, N4+ and O3+ ions at Shanghai high temperature super conductor electron beam ion trap (SH-HtscEBIT). The EUV spectra were also simulated theoretically via a collisional radiative model. In the calculation, the second-order relativistic many-body perturbation theory approach based on the flexible atomic code was used to calculate the energy levels and transition rates; the close-coupling R-matrix approach and relativistic distorted wave method were utilized to calculate the collision strength of electron impact excitation. In comparison with the spectroscopic measurements at EBIT device, the differences between the measured and simulated relative line intensities were obtained. The responsivity calibration for the spectrometer was then achieved by a 3rd degree polynomial function fitting. Our measurement shows that the responsivity between 175 and 435 angstrom varies by factor of similar to 46. The two results of calibration demonstrated a consistency within an average deviation of 24%. In addition, an evaluation of our calculations on C IV, N V and O IV line emissions in this wavelength region was given. (C) 2017 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
资助项目	National Natural Science Foundation of China[11405033]
WOS关键词	PLASMA DIAGNOSTICS ; TRANSITION RATES ; VUV
WOS研究方向	Science & Technology - Other Topics ; Materials Science ; Physics
语种	英语
出版者	AMER INST PHYSICS
WOS记录号	WOS:000400396100063
资助机构	National Natural Science Foundation of China
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/45210]
专题	中国科学院近代物理研究所
通讯作者	Xiao, J.
作者单位	1.Minist Educ, Key Lab Appl Ion Beam Phys, Shanghai 200433, Peoples R China 2.Fudan Univ, Inst Modern Phys, Shanghai EBIT Lab, Shanghai 200433, Peoples R China 3.Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Peoples R China
推荐引用方式 GB/T 7714	Tu, B.,Li, M. C.,Lu, Q. F.,et al. Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 angstrom[J]. AIP ADVANCES,2017,7:7.
APA	Tu, B..,Li, M. C..,Lu, Q. F..,Zhao, Z. Z..,Shen, Y..,...&Zou, Y..(2017).Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 angstrom.AIP ADVANCES,7,7.
MLA	Tu, B.,et al."Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 angstrom".AIP ADVANCES 7(2017):7.