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Electron-ion interactions for trapped highly charged Ge ions
Machtoub, G; Lopez-Urrutia, JRC; Zhang, X; Tawara, H
刊名CANADIAN JOURNAL OF PHYSICS
2006
卷号84页码:67-81
ISSN号0008-4204
DOI10.1139/P06-004
英文摘要A theoretical simulation of complex K X-ray spectra including those from dielectronic recombination and excitation processes is presented for trapped highly charged germanium ions (Geq+, q = 27-30) interacting with a dense electron beam. We carried out numerical calculations of transition rates, level energies, transition wavelengths, resonance and collision strengths, and satellite intensity factors. Analytical results related to cross sections of B- through He-like Ge ions were obtained as well. The simulated spectra, including the contribution from different charge states of Ge27+-Ge30+, show good overall agreement over a wide electron energy range with the available X-ray measurements from the Heidelberg electron beam ion trap (EBIT). We have also predicted the electron impact excitation cross-section ratios for different transitions of Ge29+ and Ge30+ ions. It should be emphasized that the present analysis can also provide new information and clues of possible temperature measurements for EBIT and other plasma diagnostics.
WOS关键词HELIUM-LIKE ARGON ; DIELECTRONIC RECOMBINATION ; HE-LIKE ; ATOMS ; SPECTRA
WOS研究方向Physics
语种英语
出版者NATL RESEARCH COUNCIL CANADA
WOS记录号WOS:000238286800005
内容类型期刊论文
源URL[http://119.78.100.186/handle/113462/26301]  
专题中国科学院近代物理研究所
通讯作者Machtoub, G
作者单位1.Inst Laser Sci, Tokyo 1828585, Japan
2.Max Planck Inst Kernphys, D-69117 Heidelberg, Germany
3.Fudan Univ, Inst Modern Phys, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China
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GB/T 7714
Machtoub, G,Lopez-Urrutia, JRC,Zhang, X,et al. Electron-ion interactions for trapped highly charged Ge ions[J]. CANADIAN JOURNAL OF PHYSICS,2006,84:67-81.
APA Machtoub, G,Lopez-Urrutia, JRC,Zhang, X,&Tawara, H.(2006).Electron-ion interactions for trapped highly charged Ge ions.CANADIAN JOURNAL OF PHYSICS,84,67-81.
MLA Machtoub, G,et al."Electron-ion interactions for trapped highly charged Ge ions".CANADIAN JOURNAL OF PHYSICS 84(2006):67-81.
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