CORC  > 西安交通大学
Alignment Method for Linear-Scale Projection Lithography Based on CCD Image Analysis
Ren, Dongxu; Zhao, Zexiang; Xi, Jianpu; Li, Bin; Li, Zhengfeng; Zhao, Huiying; Cui, Lujun; Xu, Hang
刊名SENSORS
2018
卷号18
关键词alignment method grating linear displacement sensor linear scale projection lithography
ISSN号1424-8220
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2831625
专题西安交通大学
推荐引用方式
GB/T 7714
Ren, Dongxu,Zhao, Zexiang,Xi, Jianpu,et al. Alignment Method for Linear-Scale Projection Lithography Based on CCD Image Analysis[J]. SENSORS,2018,18.
APA Ren, Dongxu.,Zhao, Zexiang.,Xi, Jianpu.,Li, Bin.,Li, Zhengfeng.,...&Xu, Hang.(2018).Alignment Method for Linear-Scale Projection Lithography Based on CCD Image Analysis.SENSORS,18.
MLA Ren, Dongxu,et al."Alignment Method for Linear-Scale Projection Lithography Based on CCD Image Analysis".SENSORS 18(2018).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace