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	Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr)(2)CoO4 films on SrTiO3 (001) substrates
	Jing, Hong-Mei; Cheng, Sheng; Lu, Lu; Liu, Ming; Liu, Kun; Cheng, Shao-Dong; Mi, Shao-Bo
刊名	JOURNAL OF CRYSTAL GROWTH
	2019
卷号	511页码:93-98
关键词	Oxides Interfaces Laser epitaxy Defects
ISSN号	0022-0248
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2827424
专题	西安交通大学
推荐引用方式 GB/T 7714	Jing, Hong-Mei,Cheng, Sheng,Lu, Lu,et al. Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr)(2)CoO4 films on SrTiO3 (001) substrates[J]. JOURNAL OF CRYSTAL GROWTH,2019,511:93-98.
APA	Jing, Hong-Mei.,Cheng, Sheng.,Lu, Lu.,Liu, Ming.,Liu, Kun.,...&Mi, Shao-Bo.(2019).Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr)(2)CoO4 films on SrTiO3 (001) substrates.JOURNAL OF CRYSTAL GROWTH,511,93-98.
MLA	Jing, Hong-Mei,et al."Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr)(2)CoO4 films on SrTiO3 (001) substrates".JOURNAL OF CRYSTAL GROWTH 511(2019):93-98.

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