Suppressing the excess OFF-state current of short-channel InAs nanowire field-effect transistors by nanoscale partial-gate | |
Wenyuan Yang ; Dong Pan ; Rui Shen ; Xinzhe Wang ; Jianhua Zhao ; Qing Chen | |
刊名 | NANOTECHNOLOGY |
2018 | |
卷号 | 29期号:41页码:415203 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/29206] |
专题 | 半导体研究所_半导体超晶格国家重点实验室 |
推荐引用方式 GB/T 7714 | Wenyuan Yang ; Dong Pan ; Rui Shen ; Xinzhe Wang ; Jianhua Zhao ; Qing Chen. Suppressing the excess OFF-state current of short-channel InAs nanowire field-effect transistors by nanoscale partial-gate[J]. NANOTECHNOLOGY,2018,29(41):415203. |
APA | Wenyuan Yang ; Dong Pan ; Rui Shen ; Xinzhe Wang ; Jianhua Zhao ; Qing Chen.(2018).Suppressing the excess OFF-state current of short-channel InAs nanowire field-effect transistors by nanoscale partial-gate.NANOTECHNOLOGY,29(41),415203. |
MLA | Wenyuan Yang ; Dong Pan ; Rui Shen ; Xinzhe Wang ; Jianhua Zhao ; Qing Chen."Suppressing the excess OFF-state current of short-channel InAs nanowire field-effect transistors by nanoscale partial-gate".NANOTECHNOLOGY 29.41(2018):415203. |
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