CHARACTERIZATION OF REFRACTORY METAL NITRIDE SCHOTTKY CONTACTS ON GaAs; CHARACTERIZATION OF REFRACTORY METAL NITRIDE SCHOTTKY CONTACTS ON GaAs | |
ZHANG Lichun | |
1989 | |
关键词 | Schottky aligned annealing contacts breakdown MESFET nitride annealed maintain Refractory Schottky aligned annealing contacts breakdown MESFET nitride annealed maintain Refractory |
英文摘要 | Thermally stable Schottky contacts are an important subject of research for self-aligned GaAs metal- semiconductor field-effect transistors.The self-aligned processing will require the gate material to maintain a good Schottky contact with GaAs substrate when subjected to high-temperature anneali...; Thermally stable Schottky contacts are an important subject of research for self-aligned GaAs metal- semiconductor field-effect transistors.The self-aligned processing will require the gate material to maintain a good Schottky contact with GaAs substrate when subjected to high-temperature anneali...; Chinese Institute of Electronics(CIE)、IEEE Beijing Section; 3 |
语种 | 英语 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/444035] |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | ZHANG Lichun. CHARACTERIZATION OF REFRACTORY METAL NITRIDE SCHOTTKY CONTACTS ON GaAs, CHARACTERIZATION OF REFRACTORY METAL NITRIDE SCHOTTKY CONTACTS ON GaAs. 1989-01-01. |
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