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Study on geometry of silicon PIN radiation detector for breakdown voltage improvement
Liu, Hong-zhi ; Yu, Min ; Shi, Bao-hua ; Qi, Lin ; Wang, Shao-nan ; Hu, An-qi ; Du, Hong ; Wang, Jin-yan ; Jin, Yu-feng ; Yang, Bing
刊名INTERNATIONAL JOURNAL OF NANOTECHNOLOGY
2015
关键词PIN detector field limiting ring simulation round corner radius breakdown voltage FIELD-LIMITING RING GUARD RING JUNCTION DEVICES PLATE
DOI10.1504/IJNT.2015.071786
英文摘要The silicon PIN radiation detectors are always used under high working voltages. The breakdown voltage improvement has been researched in this paper. The resistivity of the silicon is larger than 20,000 Omega cm and the thickness is 1 mm. The field plate and field-limiting ring as well as round corners are applied for comprehensive improvement. The impact of field limiting ring distance to the main junction is tested by varying the ring distance from 30 mu m to 260 mu m. The simulation research on ring distance is carried out. The round corner radius is researched by varying the radius from 30 mu m to 500 mu m.; National Key Laboratory of Nano/Micro Fabrication Technology of PKU; North China University of Technology; SCI(E); EI; ARTICLE; benedikt@126.com; yum@pku.edu.cn; 963280170@qq.com; qilinchilin@gmail.com; wsnxidian@163.com; 921655619@qq.com; duhong267@163.com; jywang@ime.pku.edu.cn; yfjin@pku.edu.cn; yangb@ncut.edu.cn; 10-12,SI; 753-760; 12
语种英语
内容类型期刊论文
源URL[http://ir.pku.edu.cn/handle/20.500.11897/436684]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Liu, Hong-zhi,Yu, Min,Shi, Bao-hua,et al. Study on geometry of silicon PIN radiation detector for breakdown voltage improvement[J]. INTERNATIONAL JOURNAL OF NANOTECHNOLOGY,2015.
APA Liu, Hong-zhi.,Yu, Min.,Shi, Bao-hua.,Qi, Lin.,Wang, Shao-nan.,...&Yang, Bing.(2015).Study on geometry of silicon PIN radiation detector for breakdown voltage improvement.INTERNATIONAL JOURNAL OF NANOTECHNOLOGY.
MLA Liu, Hong-zhi,et al."Study on geometry of silicon PIN radiation detector for breakdown voltage improvement".INTERNATIONAL JOURNAL OF NANOTECHNOLOGY (2015).
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