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	An effective apparatus for at-speed self-testing
	Li, XW ; Cheung, PYS
	1999
关键词	built-in self-test at-speed test multiple input shift register state transition graph non-adjacent graph PATTERN GENERATORS REGISTERS
英文摘要	This paper presents a loop-based BIST scheme for at speed testing. The structure and operation modes of the BIST scheme are described. The topological properties of the state-transition-graph of the proposed BIST scheme are analyzed. Based on it, an approach to design and efficiently implement the proposed BIST scheme have been developed. Experimental results on academic benchmark circuits are presented to demonstrate the effectiveness of the proposed BIST scheme as well as the design approach.; Engineering, Electrical & Electronic; Instruments & Instrumentation; CPCI-S(ISTP); 0
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/407060]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Li, XW,Cheung, PYS. An effective apparatus for at-speed self-testing. 1999-01-01.

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