The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron   Probes in the Aberration-Corrected Transmission Electron Microscope at   the University of Illinois

doi:10.1017/S1431927610000085

CORC > 北京大学 > 信息科学技术学院

	The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
	Wen, Jianguo ; Mabon, James ; Lei, Changhui ; Burdin, Steve ; Sammann, Ernie ; Petrov, Ivan ; Shah, Arnish B. ; Chobpattana, Varistha ; Zhang, Jiong ; Ran, Ke ; Zuo, Jian-Min ; Mishina, Satoshi ; Aoki, Toshihiro
刊名	microscopy and microanalysis
	2010
关键词	aberration-corrected scanning transmission electron microscopy high-angle annular dark-field imaging electron energy loss spectroscopy nanobeam diffraction aperture nanobeam diffraction STEM DIFFRACTION NANOCRYSTALS PERFORMANCE CRYSTALS
DOI	10.1017/S1431927610000085
英文摘要	We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped with a spherical aberration (C(s)) probe corrector. The achievement of a real space sub-Angstrom (0.1 nm) probe for scanning transmission electron microscopy (STEM) imaging is demonstrated by acquisition and modeling of high-angle annular dark-field STEM images. We show that by optimizing the illumination system, large probe currents and large collection angles for electron energy loss spectroscopy (EELS) can be combined to yield EELS fine structure data spatially resolved to the atomic scale. We demonstrate the probe forming flexibility provided by the additional lenses in the probe corrector in several ways, including the formation of nanometer-sized parallel beams for nanoarea electron diffraction, and the formation of focused probes for convergent beam electron diffraction with a range of convergence angles. The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction.; Materials Science, Multidisciplinary; Microscopy; SCI(E); 21; ARTICLE; 2; 183-193; 16
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/395857]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Wen, Jianguo,Mabon, James,Lei, Changhui,et al. The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois[J]. microscopy and microanalysis,2010.
APA	Wen, Jianguo.,Mabon, James.,Lei, Changhui.,Burdin, Steve.,Sammann, Ernie.,...&Aoki, Toshihiro.(2010).The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois.microscopy and microanalysis.
MLA	Wen, Jianguo,et al."The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois".microscopy and microanalysis (2010).