Detect Peripheral Hardware Faults Using I/O-state-based Dynamic Value   Invariants

CORC > 北京大学 > 信息科学技术学院

	Detect Peripheral Hardware Faults Using I/O-state-based Dynamic Value Invariants
	Zheng Yansong ; Lu Junlin ; Tong Dong ; Wang Keyi ; Cheng Xu
刊名	chinese journal of electronics
	2012
关键词	Fault detection Peripheral hardware fault I/O state Dynamic value invariant ERRORS
英文摘要	Hardware system has been expected to become increasingly vulnerable to faults due to continuously increasing function complexity and decreasing feature size. Using I/O-state-based dynamic value invariants, one of software visible symptoms, can probabilistically detect peripheral hardware faults. This paper explores a software solution that watches for anomalous dynamic value invariant behaviors to indicate the presence of peripheral hardware faults with low cost. The approach extracts I/O-state-based dynamic value invariants of real commodity software, and detects faults by checking any data inconsistencies arising in an application's behavior. We implemented the proof of concept in a full system simulator Bochs-P86. The experimentation with Windows XP shows that the approach is effective in detecting peripheral hardware faults. Four forms of dynamic value invariants all have over 46% coverage rate, detect more than 60% faults within 1000 instructions latency, and achieve less than 1.2% false positive rate.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000303552300005&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Engineering, Electrical & Electronic; SCI(E); EI; 0; ARTICLE; 2; 221-226; 21
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/393484]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Zheng Yansong,Lu Junlin,Tong Dong,et al. Detect Peripheral Hardware Faults Using I/O-state-based Dynamic Value Invariants[J]. chinese journal of electronics,2012.
APA	Zheng Yansong,Lu Junlin,Tong Dong,Wang Keyi,&Cheng Xu.(2012).Detect Peripheral Hardware Faults Using I/O-state-based Dynamic Value Invariants.chinese journal of electronics.
MLA	Zheng Yansong,et al."Detect Peripheral Hardware Faults Using I/O-state-based Dynamic Value Invariants".chinese journal of electronics (2012).