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	An analytical model for negative bias temperature instability
	Wang, Shengcheng ; Du, Gang ; Liu, Xiaoyan
	2010
英文摘要	Negative bias temperature instability (NBTI) has become one of the major limiters for product lifetime, and various models have been proposed in order to explain NBTI. In this paper, an analytical model for DC NBTI and AC NBTI is proposed. This model describes the different time dependence of DC NBTI degradation at both short- and long-term stresses, and also reproduces the frequency and duty cycle dependencies of NBTI under AC stress. ?2010 IEEE.; EI; 0
语种	英语
DOI标识	10.1109/ICSICT.2010.5667291
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/329594]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Wang, Shengcheng,Du, Gang,Liu, Xiaoyan. An analytical model for negative bias temperature instability. 2010-01-01.

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