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	Computational investigation of velocity overshoot effects in double gate MOSFETs
	Hou, D.Q. ; Xia, Z.L. ; Du, G. ; Liu, X.Y. ; Wang, Y. ; Kang, J.F. ; Han, R.Q.
	2004
英文摘要	The velocity overshoot effect has been simulated in nano-scale double gate MOSFETs and compared by different simulation method including hydrodynamic model (HD model) and Monte Carlo method (MC method). As we know, the hydrodynamic model tends to overestimate the velocity overshoot, so how much the overestimate of HD model can reach to, and how this overestimate can impair the simulation accuracy of the final device characteristics, is investigated. Based on the simulation results, the quantitative study of the velocity overshoot effect and its related error on the performance of DG MOSFETs are obtained. ?2004 IEEE.; EI; 0
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/295338]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Hou, D.Q.,Xia, Z.L.,Du, G.,et al. Computational investigation of velocity overshoot effects in double gate MOSFETs. 2004-01-01.

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