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	Numerical characterization of multi-dielectric green's function for floating random walk based capacitance extraction
	Zhuang, Hao ; Yu, Wenjian ; Hu, Gang ; Ye, Zuochang
	2011
英文摘要	The floating random walk (FRW) algorithm has several advantages for extracting interconnect capacitance. However, for multi-layer dielectrics in VLSI technology, the efficiency of FRW algorithm would be degraded due to the frequent stop of walk at dielectric interface. In this paper, an approach is proposed to calculate multi-dielectric Green's function, which is utilized to enable hops across dielectric interface in the FRW. Numerical results show that the proposed approach is about 4X faster than an existing method, and brings several times speedup to the FRW-based capacitance extraction for actual multi-dielectric interconnect structures. ? 2011 IEEE.; EI; 0
语种	英语
DOI标识	10.1109/ASICON.2011.6157189
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/294843]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Zhuang, Hao,Yu, Wenjian,Hu, Gang,et al. Numerical characterization of multi-dielectric green's function for floating random walk based capacitance extraction. 2011-01-01.

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