Self-Depleted T-gate Schottky Barrier Tunneling FET with Low Average Subthreshold Slope and High I-ON/I-OFF by Gate Configuration and Barrier Modulation | |
Huang, Qianqian ; Zhan, Zhan ; Huang, Ru ; Mao, Xiang ; Zhang, Lijie ; Qiu, Yingxin ; Wang, Yangyuan | |
2011 | |
关键词 | SOI |
英文摘要 | In this paper, a novel silicon-based T-gate Schottky barrier tunneling FET (TSB-TFET) is proposed and experimentally demonstrated. With enhanced electric field at source side through gate configuration for steeper subthreshold slope (SS), the device with self-depleted structure can effectively suppress the leakage current and simultaneously achieve the dominant Schottky barrier tunneling current for high ON-current without area penalty, which can alleviate the problems in silicon TFET. In addition, the proposed TSB-TFET can have comparable DIBL effect and reduced gate-to-drain capacitance compared with traditional TFET. Further device optimization is experimentally achieved by extended multi-finger gate configuration of the same footprint and barrier modulation by dopant segregation Schottky technology. With compatible bulk CMOS technology, the fabricated device can achieve steep SS over almost 5 decades of current, as well as high I-ON/I-OFF ratio (similar to 10(7)). The proposed device with high compatibility is very promising for future low power system applications.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000300015300096&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Engineering, Electrical & Electronic; Physics, Applied; CPCI-S(ISTP); 0 |
语种 | 英语 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/293133] |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | Huang, Qianqian,Zhan, Zhan,Huang, Ru,et al. Self-Depleted T-gate Schottky Barrier Tunneling FET with Low Average Subthreshold Slope and High I-ON/I-OFF by Gate Configuration and Barrier Modulation. 2011-01-01. |
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