Resistive Switching Model for Electrolyte-oxide-semiconductor (EOS) Structure | |
Ma, X. Y. ; Sun, G. C. ; Chen, Y. F. ; Wu, W. G. | |
2013 | |
关键词 | electrolyte-oxide-semiconductor (EOS) structure resistive switching model one-way conductivity NANOIONICS TRANSPORT MEMORIES |
英文摘要 | We find that the Electrolyte-Oxide-Semiconductor (EOS) structure, which is utilized a lot in micro/nanofluidic devices, is not perfectly insulated as previously believed. There is a significant leakage current through the insulator, and the I-V relationship shows one-way conductivity like a diode. We build a model considering the implantation of ions under forward bias and formation of conductive filaments in the oxide layer. Samples with oxide layers of different thicknesses and various fabrication processes were tested to verify our hypotheses. This structure provides a simple means to fabricate half-fluidic diodes, and can be utilized for ion detection and current control in microfluidic devices.; Engineering, Biomedical; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; CPCI-S(ISTP); 0 |
语种 | 英语 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/292567] |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | Ma, X. Y.,Sun, G. C.,Chen, Y. F.,et al. Resistive Switching Model for Electrolyte-oxide-semiconductor (EOS) Structure. 2013-01-01. |
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