A Simple Circuit to Investigate Threshold Voltage Variation and Its   Application in Monitoring Negative Bias Temperature Instability   Degradation

doi:10.7567/JJAP.52.04CC06

CORC > 北京大学 > 信息科学技术学院

	A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation
	Hong, Jie ; He, Yandong ; Zhang, Ganggang ; Zhang, Xing
刊名	日本应用物理学杂志
	2013
关键词	V-T EXTRACTOR TRANSISTORS
DOI	10.7567/JJAP.52.04CC06
英文摘要	This paper presents a test circuit which can be used to analyze the p-MOSFET threshold voltage (V-T) shift and fluctuation. The proposed circuit includes two p-MOSFETs, series connection. Using the circuit, we can directly measure threshold voltage shift on the output side and gather fluctuation statistics of p-MOSFET devices. The principle and the sensitivity of this method are demonstrated, followed by simulation and experimental results. A predictive model of negative bias temperature instability (NBTI) is introduced to analyze the PMOS degradation under constant stress. The NBTI stress experimental results have shown that this circuit can monitor NBTI degradation accurately, and offer a significant improvement in efficiency over existing I-d-V-g methods. (C) 2013 The Japan Society of Applied Physics; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000320002400025&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Physics, Applied; SCI(E); EI; 0; ARTICLE; 4,SI; 52
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/291756]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Hong, Jie,He, Yandong,Zhang, Ganggang,et al. A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation[J]. 日本应用物理学杂志,2013.
APA	Hong, Jie,He, Yandong,Zhang, Ganggang,&Zhang, Xing.(2013).A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation.日本应用物理学杂志.
MLA	Hong, Jie,et al."A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation".日本应用物理学杂志 (2013).