Properties and structure of high coercivity Sm(Co, Al, Si)/Cr sputtered thin films | |
Wang, X ; Zhang, DC ; Li, ZY | |
2002 | |
关键词 | Sm(Co, Al, Si)/Cr thin films coercivity H-c anealing MAGNETIC-PROPERTIES MEDIA |
英文摘要 | Sm(Co, Al, Si)/Cr films have been prepared as one kind of promising materials. The interface exists a few of nanocrystalline grains, whereas other area is amorphous in the as-deposited state. After subsequent heat treatment, the amorphous phase around the position corresponding to the SmCo2Al2.8Si0.2 (10 (1) over bar 1) line starts to evolve into a broad nanocrystalline peak. The optimal value of thickness for Cr underlayer and Sm(Co, Al, Si) film, Sm content, etc results in high coercivity H-c. After being annealed at 500 degreesC for 25 min, the optimal value of coercivity H-c (up to 1042 kA/m) and squareness ratio S (0.9similar to1) has been obtained. The lattice matching of SMCo(2)l(2.8)Si(0.2) Sm(Co, Al, Si)(5) {10 (1) over bar 1} and Cr{110}, {1 1 (2) over bar0} and {200},etc. has been found at the different conditions, The conclusion of H-c,H-SmCoAlSi>H-c,H-SmCo has also been gotten.; Engineering, Multidisciplinary; Mathematics, Applied; Mechanics; Physics, Mathematical; SCI(E); CPCI-S(ISTP); 1 |
语种 | 英语 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/291566] |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | Wang, X,Zhang, DC,Li, ZY. Properties and structure of high coercivity Sm(Co, Al, Si)/Cr sputtered thin films. 2002-01-01. |
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