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	Performing probe experiments in the SEM
	Peng, LM ; Chen, Q ; Liang, XL ; Gao, S ; Wang, JY ; Kleindiek, S ; Tai, SW
	2004
关键词	electron microscope nanoprobes nanotechnology nanomanipulation
英文摘要	A four nanoprobe system has been installed inside a FEI XL30 F scanning electron microscope (SEM), and shown to be fully compatible with the normal functions of the SEM and also a Gatan cold stage (model C1003, -185-400degreesC). With some selected examples of applications, we have shown that this nanoprobe system may be used effectively for gripping, moving and manipulating nanoobjects, e.g. carbon nanotubes, setting up electric contacts for electronic measurements, tailoring the structure of the nanoobject by cutting, etc. and even for making unexpected nanostructures, e.g. a nanohook. Applications in other areas have also been speculated, limitations or disadvantages of the current design of the probe system were discussed, and methods for possible improvement were suggested. (C) 2004 Elsevier Ltd. All rights reserved.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000221721000015&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Microscopy; SCI(E); CPCI-S(ISTP); PubMed; 33
语种	英语
DOI标识	10.1016/j.micron.2003.12.005
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/151892]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Peng, LM,Chen, Q,Liang, XL,et al. Performing probe experiments in the SEM. 2004-01-01.

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