Structure Characterization by 3D ED and PXRD; Structure Characterization by 3D ED and PXRD | |
Junliang Sun | |
2016 | |
关键词 | challenging mature enough synthesize defects overlapping crystalline dimensions Electron sizes challenging mature enough synthesize defects overlapping crystalline dimensions Electron sizes |
英文摘要 | Structure determination of nano-size crystals or crystals with defects is always a challenging problem.For quite lots of materials,it is very difficult to synthesize large/good enough crystals for single crystal X-ray diffraction studies.Powder X-ray diffraction(PXRD)is the major method for their atomic structure determination,PXRD is a quite mature technique and lots of powder; Structure determination of nano-size crystals or crystals with defects is always a challenging problem.For quite lots of materials,it is very difficult to synthesize large/good enough crystals for single crystal X-ray diffraction studies.Powder X-ray diffraction(PXRD)is the major method for their atomic structure determination,PXRD is a quite mature technique and lots of powder; 中国晶体学会; 1 |
语种 | 英语 |
出处 | 中国晶体学会第六届学术年会暨会员代表大会——多晶(粉晶)衍射分会 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/479695] |
专题 | 化学与分子工程学院 |
推荐引用方式 GB/T 7714 | Junliang Sun. Structure Characterization by 3D ED and PXRD, Structure Characterization by 3D ED and PXRD. 2016-01-01. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论