Characterization of Kinoform X-ray lens using image stitching method based on marked structures
Hua, Wenqiang; He, Qili; Sheng, Weifan; Zhu, Peiping; Yuan, Qingxi; Wang, Jie; Zhu, Zhongzhu; Liao, Keliang; Yuan QX(袁清习); Zhu PP(朱佩平)
刊名COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE
2018
卷号875页码:88-97
ISSN号1865-0929
DOI10.1007/978-981-13-1702-6_9
文献子类Proceedings Paper
英文摘要The unique structure of the kinoform x-ray lens render most image stitching methods difficult to realize the image registration of sub-images acquired by commercial optical microscope with the high power objective, yet it is important to evaluate the fabrication defects using image processing methods in the foundation of the stitched image. In this work we demonstrate the quantitative characterization of the kinoform x-ray lens by using image stitching method based on extracting the geometric features of dedicated marked structures, which could not only avoid the problem of lacking effective features in the lens structure but also provide a reference for the scaling and rotation operations during the image alignment. The proposed stitching method provides us a convenient way to analyze the shape error and various fabrication imperfections for the kinoform x-ray lens. © Springer Nature Singapore Pte Ltd., 2018.
会议地点Beijing, China
语种英语
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/286602]  
专题高能物理研究所_多学科研究中心
通讯作者Liao KL(廖可梁)
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Hua, Wenqiang,He, Qili,Sheng, Weifan,et al. Characterization of Kinoform X-ray lens using image stitching method based on marked structures[J]. COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE,2018,875:88-97.
APA Hua, Wenqiang.,He, Qili.,Sheng, Weifan.,Zhu, Peiping.,Yuan, Qingxi.,...&廖可梁.(2018).Characterization of Kinoform X-ray lens using image stitching method based on marked structures.COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE,875,88-97.
MLA Hua, Wenqiang,et al."Characterization of Kinoform X-ray lens using image stitching method based on marked structures".COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE 875(2018):88-97.
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