Characterization of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor
An, M; Zhang, W; Xiao, L; Gao, C; Chen, C; Han, M; Huang, G; Ji, R; Li, X; Liu, J
刊名JOURNAL OF INSTRUMENTATION
2017
卷号12页码:C03004
关键词Electronic detector readout concepts (solid-state) Front-end electronics for detector readout Pixelated detectors and associated VLSI electronics VLSI circuits
ISSN号1748-0221
DOI10.1088/1748-0221/12/03/C03004
文献子类Article; Proceedings Paper
英文摘要We present the detailed study of the digital readout of Topmetal-II- CMOS pixel direct charge sensor. Topmetal-II- is an integrated sensor with an array of 72 x 72 pixels each capable of directly collecting external charge through exposed metal electrodes in the topmost metal layer. In addition to the time-shared multiplexing readout of the analog output from Charge Sensitive Amplifiers in each pixel, hits are also generated through comparators in each pixel with individually adjustable thresholds. The hits are read out via a column-based priority logic structure, retaining both hit location and time information. The in-array column-based priority logic features with a full clock-less circuitry hence there is no continuously running clock distributed in the pixel and matrix logic. These characteristics enable its use as the charge readout device in future Time Projection Chambers without gaseous gain mechanism, which has unique advantages in low background and low rate-density experiments. We studied the detailed working behavior and performance of this readout, and demonstrated its functional validity and potential in imaging applications.
会议地点Karlsruhe Inst Technol, Karlsruhe, GERMANY
会议日期SEP 26-30, 2016
WOS研究方向Instruments & Instrumentation
语种英语
WOS记录号WOS:000406997400004
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/284808]  
专题中国科学院高能物理研究所_中国散裂中子源
高能物理研究所_实验物理中心
高能物理研究所_核技术应用研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
An, M,Zhang, W,Xiao, L,et al. Characterization of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor[J]. JOURNAL OF INSTRUMENTATION,2017,12:C03004.
APA An, M.,Zhang, W.,Xiao, L.,Gao, C.,Chen, C.,...&Zhou, W.(2017).Characterization of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor.JOURNAL OF INSTRUMENTATION,12,C03004.
MLA An, M,et al."Characterization of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor".JOURNAL OF INSTRUMENTATION 12(2017):C03004.
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