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Molecular Glass Photoresists with High Resolution, Low LER, and High Sensitivity for EUV Lithography
Peng, Xiaoman1; Wang, Yafei1; Xu, Jian1; Yuan, Hua1; Wang, Liangqian1; Zhang, Tao1; Guo, Xudong1; Wang, Shuangqing1; Li, Yi2; Yang, Guoqiang1
刊名MACROMOLECULAR MATERIALS AND ENGINEERING
2018-06-01
卷号303期号:6
关键词Euv Lithography Molecular Glasses Photoresists
ISSN号1438-7492
DOI10.1002/mame.201700654
英文摘要Novel molecular glasses (MGs) containing bisphenol A backbone (BPA-6 and BPA-10) are synthesized and characterized. BPA-6 and BAP-10 are excellent amorphous materials for extreme ultraviolet (EUV) patterning applications with good thermal stability (T-d more than 160 degrees C). The MGs can be used as positive-tone photoresists combined with triphenylsulfonium perfluoro-1-butanesulfonate and trioctylamine dissolved in propylene glycol monomethyl ether acetate. High-resolution feature sizes as small as 23.1 nm with extremely low line edge roughness (less than 2 nm), high sensitivity (less than 20 mJ cm(-2)), and good high aspect ratio patterns are obtained by using EUV lithography.
语种英语
出版者WILEY-V C H VERLAG GMBH
WOS记录号WOS:000435279800006
内容类型期刊论文
源URL[http://ir.iccas.ac.cn/handle/121111/42625]  
专题中国科学院化学研究所
通讯作者Wang, Shuangqing; Li, Yi; Yang, Guoqiang
作者单位1.Univ Chinese Acad Sci, Chinese Acad Sci, Inst Chem, Beijing Natl Lab Mol Sci,Key Lab Photochem, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Chinese Acad Sci, Tech Inst Phys & Chem, Key Lab Photochem Convers & Optoelect Mat, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714
Peng, Xiaoman,Wang, Yafei,Xu, Jian,et al. Molecular Glass Photoresists with High Resolution, Low LER, and High Sensitivity for EUV Lithography[J]. MACROMOLECULAR MATERIALS AND ENGINEERING,2018,303(6).
APA Peng, Xiaoman.,Wang, Yafei.,Xu, Jian.,Yuan, Hua.,Wang, Liangqian.,...&Yang, Guoqiang.(2018).Molecular Glass Photoresists with High Resolution, Low LER, and High Sensitivity for EUV Lithography.MACROMOLECULAR MATERIALS AND ENGINEERING,303(6).
MLA Peng, Xiaoman,et al."Molecular Glass Photoresists with High Resolution, Low LER, and High Sensitivity for EUV Lithography".MACROMOLECULAR MATERIALS AND ENGINEERING 303.6(2018).
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