Residual impurities and electrical properties of undoped LEC InAs single crystals
Hu Weijie ; Zhao Youwen ; Sun Wenrong ; Duan Manlong ; Dong Zhiyuan ; Yang Jun
刊名半导体学报
2010
卷号31期号:4页码:042001-1-042001-4
中文摘要impurities and their influence on the properties of inas single crystals have been studied by combining the results of glow discharge mass spectrometry (gdms), hall measurements, raman scattering and infrared absorption. the results indicate that carbon is a major impurity in lec-inas single crystals and exhibits a significant influence on the electrical and optical properties.
学科主题半导体材料
收录类别CSCD
语种中文
公开日期2011-08-16
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/21624]  
专题半导体研究所_中科院半导体材料科学重点实验室
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GB/T 7714
Hu Weijie,Zhao Youwen,Sun Wenrong,et al. Residual impurities and electrical properties of undoped LEC InAs single crystals[J]. 半导体学报,2010,31(4):042001-1-042001-4.
APA Hu Weijie,Zhao Youwen,Sun Wenrong,Duan Manlong,Dong Zhiyuan,&Yang Jun.(2010).Residual impurities and electrical properties of undoped LEC InAs single crystals.半导体学报,31(4),042001-1-042001-4.
MLA Hu Weijie,et al."Residual impurities and electrical properties of undoped LEC InAs single crystals".半导体学报 31.4(2010):042001-1-042001-4.
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