Epitaxial sic grown on silicon-on-insulator substrate with ultra-thin silicon-over-layer | |
Huang, FY; Wang, XF; Sun, GS; Zhao, WS; Zeng, YP; Bian, EL | |
刊名 | Thin solid films
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2005-07-22 | |
卷号 | 484期号:1-2页码:261-264 |
关键词 | Silicon carbide Chemical vapor deposition Epitaxy |
ISSN号 | 0040-6090 |
DOI | 10.1016/j.tsf.2005.01.083 |
通讯作者 | Huang, fy(fyhuang@seu.edu.cn) |
英文摘要 | We report on the comparative studies of epitaxial sic films grown on silicon-on-insulator (soi) and si bulk substrates. the silicon-over-layer (sol) on the soi has been thinned down to different thicknesses, with the thinnest about 10 nm. it has been found that the full-width-at-half-maxim in the x-ray diffraction spectrum from the sic films decreases as the sol thickness decreases, indicating improved quality of the sic film. a similar trend has also been found in the raman spectrum. one of the potential explanations for the observation is strain accommodation by the ultra-thin soi substrate. (c) 2005 elsevier b.v. all rights reserved. |
WOS关键词 | SOI |
WOS研究方向 | Materials Science ; Physics |
WOS类目 | Materials Science, Multidisciplinary ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE SA |
WOS记录号 | WOS:000230045900040 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2426306 |
专题 | 半导体研究所 |
通讯作者 | Huang, FY |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China 2.STEK, Shanghai 201203, Peoples R China |
推荐引用方式 GB/T 7714 | Huang, FY,Wang, XF,Sun, GS,et al. Epitaxial sic grown on silicon-on-insulator substrate with ultra-thin silicon-over-layer[J]. Thin solid films,2005,484(1-2):261-264. |
APA | Huang, FY,Wang, XF,Sun, GS,Zhao, WS,Zeng, YP,&Bian, EL.(2005).Epitaxial sic grown on silicon-on-insulator substrate with ultra-thin silicon-over-layer.Thin solid films,484(1-2),261-264. |
MLA | Huang, FY,et al."Epitaxial sic grown on silicon-on-insulator substrate with ultra-thin silicon-over-layer".Thin solid films 484.1-2(2005):261-264. |
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