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	Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction
	Li,Yangfeng1,2; Die,Junhui1,2; Yan,Shen1,2; Deng,Zhen1,2; Ma,Ziguang1,2; Wang,Lu1,2; Jia,Haiqiang1,2; Wang,Wenxin1,2; Jiang,Yang1,2; Chen,Hong1,2
刊名	Applied physics express
	2019-03-13
卷号	12期号:4
关键词	Xrd Mqws Interface roughness
ISSN号	1882-0778
DOI	10.7567/1882-0786/ab0540
通讯作者	Jiang,yang() ; Chen,hong()
英文摘要	Abstract x-ray diffraction patterns are widely used to calculate the periodicity fluctuation of multiple quantum wells (mqws). nonetheless, we find the commonly used formula sometimes cannot give an exact linear relationship between the full width at half maximum and the satellite peak orders. here, based on the formula, we deduce a more accurate formula to characterize the periodicity fluctuations in ingan/gan mqws. the revised formula has higher linearity correlation degree and the calculated interface roughness coincides well with x-ray reflectivity measurement results.
语种	英语
出版者	IOP Publishing
WOS记录号	IOP:1882-0778-12-4-AB0540
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2373981
专题	物理研究所
通讯作者	Jiang,Yang; Chen,Hong
作者单位	1.Key Laboratory for Renewable Energy, Beijing Key Laboratory for New Energy Materials and Devices, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, People’s Republic of China 2.University of Chinese Academy of Sciences, Beijing 100049, People’s Republic of China
推荐引用方式 GB/T 7714	Li,Yangfeng,Die,Junhui,Yan,Shen,et al. Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction[J]. Applied physics express,2019,12(4).
APA	Li,Yangfeng.,Die,Junhui.,Yan,Shen.,Deng,Zhen.,Ma,Ziguang.,...&Chen,Hong.(2019).Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction.Applied physics express,12(4).
MLA	Li,Yangfeng,et al."Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction".Applied physics express 12.4(2019).

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