| Measuring the local mobility of graphene on semiconductors | |
Wang, Jianfeng(王建峰) ; Pan, Anlian; Xu, Gengzhao(徐耿钊
); Xu, Ke(徐科); Zhong, Haijian(钟海舰); Liu, Zhenghui(刘争晖)
| |
| 刊名 | PHYSICAL REVIEW MATERIALS
 |
| 2018 | |
| 其他题名 | Measuring the local mobility of graphene on semiconductors |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/6305]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
| 作者单位 | 中国科学院苏州纳米技术与纳米仿生研究所 |
| 推荐引用方式 GB/T 7714 | Wang, Jianfeng,Pan, Anlian,Xu, Gengzhao,et al. Measuring the local mobility of graphene on semiconductors[J]. PHYSICAL REVIEW MATERIALS,2018. |
| APA | Wang, Jianfeng,Pan, Anlian,Xu, Gengzhao,Xu, Ke,Zhong, Haijian,&Liu, Zhenghui.(2018).Measuring the local mobility of graphene on semiconductors.PHYSICAL REVIEW MATERIALS. |
| MLA | Wang, Jianfeng,et al."Measuring the local mobility of graphene on semiconductors".PHYSICAL REVIEW MATERIALS (2018). |
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