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	Electrode design of coplanar-grid diamond film detectors by finite element method
	Zeng, Qingkai[1]; Pan, Xiaoyu[2]; Bi, Mei[3]; Yan, Xingmao[4]; Wang, Linjun[5]; Huang, Jian[6]; Tang, Ke[7]; Zhang, Jijun[8]; Xia, Yiben[9]
	2010
会议名称	2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
会议日期	2010-11-01
页码	1841-1843
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2313727
专题	上海大学
作者单位	[1]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[2]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[3]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[4]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[5]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[6]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[7]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[8]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China[9]School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China
推荐引用方式 GB/T 7714	Zeng, Qingkai[1],Pan, Xiaoyu[2],Bi, Mei[3],et al. Electrode design of coplanar-grid diamond film detectors by finite element method[C]. 见:2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology. 2010-11-01.

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