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	Analysis on thickness dependence of Jc caused by dislocations and grain boundaries in YBCO superconducting films
	Lei, Z.[1]; Ding, J.[2]; Weng, P.[3]; Cai, X.[4]
	2013
会议名称	6th International Conference on Nonlinear Mechanics, ICNM 2013
会议日期	2013-08-12
页码	158-160
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2287349
专题	上海大学
作者单位	[1]Shanghai Institute of Applied Mathematics and Mechanics, Shanghai University, Shanghai, China[2]Shanghai Institute of Applied Mathematics and Mechanics, Shanghai University, Shanghai, China[3]Shanghai Institute of Applied Mathematics and Mechanics, Shanghai University, Shanghai, China[4]Shanghai Institute of Applied Mathematics and Mechanics, Shanghai University, Shanghai, China
推荐引用方式 GB/T 7714	Lei, Z.[1],Ding, J.[2],Weng, P.[3],et al. Analysis on thickness dependence of Jc caused by dislocations and grain boundaries in YBCO superconducting films[C]. 见:6th International Conference on Nonlinear Mechanics, ICNM 2013. 2013-08-12.

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