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	Deep Insight into Surface Flatness Based on AFM Images Illustrated by Ni-Based Alloy
	Guo, Yan Qun[1]; Chi, Chang Xin[2]; Shi, Xiao Liang[3]; Ren, Heng[4]; Liu, Zhi Yong[5]; Lu, Yu Ming[6]; Cai, Chuan Bing[7]
	2015
会议名称	IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
会议日期	2015-01-01
关键词	AFM image surface flatness Ni-based alloy
页码	589-590
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2240395
专题	上海大学
作者单位	1.[1]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 2.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 3.[2]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 4.[3]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 5.[4]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 6.[5]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 7.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 8.[6]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 9.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 10.[7]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China.
推荐引用方式 GB/T 7714	Guo, Yan Qun[1],Chi, Chang Xin[2],Shi, Xiao Liang[3],et al. Deep Insight into Surface Flatness Based on AFM Images Illustrated by Ni-Based Alloy[C]. 见:IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD). 2015-01-01.

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