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	A high-speed and low-noise intelligent test system for infrared detectors
	Jia, Tianshi[1]; Xue, Yulong[2]; Cui, Kun[3]; Kong, Fansheng[4]
	2016
会议名称	Conference on Infrared, Millimeter-Wave, and Terahertz Technologies IV
会议日期	2016-10-12
关键词	Infrared High-speed Low-noise Data acquisition Test system
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2227076
专题	上海大学
作者单位	[1]Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, China |Shanghai University, Shanghai, 200072, China[2]Shanghai University, Shanghai, 200072, China[3]Shanghai University, Shanghai, 200072, China[4]Shanghai University, Shanghai, 200072, China
推荐引用方式 GB/T 7714	Jia, Tianshi[1],Xue, Yulong[2],Cui, Kun[3],et al. A high-speed and low-noise intelligent test system for infrared detectors[C]. 见:Conference on Infrared, Millimeter-Wave, and Terahertz Technologies IV. 2016-10-12.

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