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	Automatic IC Character Recognition System for IC Test Handler Based on SVM
	Fan, Jiang[1]; Haotian, Liu[2]; Bing, Bai[3]; Xiaojin, Zhu[4]
	2016
会议名称	8th International Conference on Intelligent Human-Machine Systems and Cybernetics (IHMSC)
会议日期	2016-09-11
关键词	support vector machine IC chips inspection character recognition feature extraction
页码	239-242
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2227042
专题	上海大学
作者单位	[1]School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China[2]School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China[3]School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China[4]School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China
推荐引用方式 GB/T 7714	Fan, Jiang[1],Haotian, Liu[2],Bing, Bai[3],et al. Automatic IC Character Recognition System for IC Test Handler Based on SVM[C]. 见:8th International Conference on Intelligent Human-Machine Systems and Cybernetics (IHMSC). 2016-09-11.

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