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	Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS, XPS, and AFM (EI收录)
	Zheng, Z.J.[1,2]; Gao, Y.[1,3]; Gui, Y.[1]; Zhu, M.[1,3]
刊名	Journal of Solid State Electrochemistry
	2014
卷号	18页码:2201-2210
关键词	Atomic force microscopy Electrochemical impedance spectroscopy Microstructure Stainless steel
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2216525
专题	华南理工大学
作者单位	1.[1] School of Materials Science and Engineering, South China University of Technology, Guangzhou 510641, China 2.[2] School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou 510641, China 3.[3] Key Laboratory of Advanced Energy Storage Materials of Guangdong Province, Guangzhou, China
推荐引用方式 GB/T 7714	Zheng, Z.J.[1,2],Gao, Y.[1,3],Gui, Y.[1],等. Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS, XPS, and AFM (EI收录)[J]. Journal of Solid State Electrochemistry,2014,18:2201-2210.
APA	Zheng, Z.J.[1,2],Gao, Y.[1,3],Gui, Y.[1],&Zhu, M.[1,3].(2014).Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS, XPS, and AFM (EI收录).Journal of Solid State Electrochemistry,18,2201-2210.
MLA	Zheng, Z.J.[1,2],et al."Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS, XPS, and AFM (EI收录)".Journal of Solid State Electrochemistry 18(2014):2201-2210.

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