CORC  > 上海大学
Automatic Character Detection System for IC Test Handler Based on Active Learning SVM
Wang, Tianshan[1]; Jiang, Fan[2]; Zhu, Xiaojin[3]; Zhang, Hesheng[4]; Gao, Zhiyuan[5]
2017
会议名称INTELLIGENT COMPUTING, NETWORKED CONTROL, AND THEIR ENGINEERING APPLICATIONS, PT II
会议日期2017-01-01
关键词Active learning SVM IC chips Character recognition
页码333-342
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/2182458
专题上海大学
作者单位1.[1]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China.
2.[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China.
3.[3]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China.
4.[4]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China.
5.[5]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China.
推荐引用方式
GB/T 7714
Wang, Tianshan[1],Jiang, Fan[2],Zhu, Xiaojin[3],et al. Automatic Character Detection System for IC Test Handler Based on Active Learning SVM[C]. 见:INTELLIGENT COMPUTING, NETWORKED CONTROL, AND THEIR ENGINEERING APPLICATIONS, PT II. 2017-01-01.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace