Automatic Character Detection System for IC Test Handler Based on Active Learning SVM | |
Wang, Tianshan[1]; Jiang, Fan[2]; Zhu, Xiaojin[3]; Zhang, Hesheng[4]; Gao, Zhiyuan[5] | |
2017 | |
会议名称 | INTELLIGENT COMPUTING, NETWORKED CONTROL, AND THEIR ENGINEERING APPLICATIONS, PT II |
会议日期 | 2017-01-01 |
关键词 | Active learning SVM IC chips Character recognition |
页码 | 333-342 |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2182458 |
专题 | 上海大学 |
作者单位 | 1.[1]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 3.[3]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 4.[4]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 5.[5]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. |
推荐引用方式 GB/T 7714 | Wang, Tianshan[1],Jiang, Fan[2],Zhu, Xiaojin[3],et al. Automatic Character Detection System for IC Test Handler Based on Active Learning SVM[C]. 见:INTELLIGENT COMPUTING, NETWORKED CONTROL, AND THEIR ENGINEERING APPLICATIONS, PT II. 2017-01-01. |
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