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	Correlation-steered scanning for scanning probe microscopes to overcome thermal drift for ultra-long time scanning
	Feng,Zhihua; Long,Qian; Zhang,Liansheng; Zhang,Jie; Liu,Yongbin
刊名	Ultramicroscopy
	2016
卷号	Vol.166页码:16-26
关键词	ATOMIC-FORCE MICROSCOPY DIGITAL IMAGE CORRELATION ELIMINATION HYSTERESIS DISTORTION COMPENSATION CHARGE
ISSN号	0304-3991
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2159872
专题	安徽大学
作者单位	1.Univ Sci & Technol China, Dept Precis Machinery & Precis Instrumentat, Hefei 230026, Anhui, Peoples R China 2.Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Anhui, Peoples R China 3.Anhui Univ, Dept Mech Engn, Hefei 230061, Anhui, Peoples R China
推荐引用方式 GB/T 7714	Feng,Zhihua,Long,Qian,Zhang,Liansheng,et al. Correlation-steered scanning for scanning probe microscopes to overcome thermal drift for ultra-long time scanning[J]. Ultramicroscopy,2016,Vol.166:16-26.
APA	Feng,Zhihua,Long,Qian,Zhang,Liansheng,Zhang,Jie,&Liu,Yongbin.(2016).Correlation-steered scanning for scanning probe microscopes to overcome thermal drift for ultra-long time scanning.Ultramicroscopy,Vol.166,16-26.
MLA	Feng,Zhihua,et al."Correlation-steered scanning for scanning probe microscopes to overcome thermal drift for ultra-long time scanning".Ultramicroscopy Vol.166(2016):16-26.

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