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	Data analysis method of the small samples and zero-failure data for space TWT accelerated life test (EI收录)
	Song, Fangfang[1,2]; Zhou, Zhenwei[2]; Li, Shajin[2]; En, Yunfei[2]; Li, Bin[2]
会议名称	Proceedings of the Electronic Packaging Technology Conference, EPTC
会议日期	August 12, 2014 - August 15, 2014
会议地点	Chengdu, China
关键词	Cathodes Data handling Data processing Electron tubes Electronics packaging Least squares approximations Microwave tubes Testing Tubes (components)
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2045786
专题	华南理工大学
作者单位	1.[1] School of Electron and Information, South China University of Technology, Guangzhou, China 2.[2] Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, Electronic Produce Reliability and Environmental Testing Research Institute, Guangzhou, China
推荐引用方式 GB/T 7714	Song, Fangfang[1,2],Zhou, Zhenwei[2],Li, Shajin[2],等. Data analysis method of the small samples and zero-failure data for space TWT accelerated life test (EI收录)[C]. 见:Proceedings of the Electronic Packaging Technology Conference, EPTC. Chengdu, China. August 12, 2014 - August 15, 2014.

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