The Storage Failure Mode and Failure Mechanism Study of High-Power Klystron (CPCI-S收录) | |
Song, Fangfang[1,2]; Li, Ruguang[2]; Liu, Liyuan[2]; En, Yunfei[2]; Li, Bin[1] | |
会议名称 | PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II |
关键词 | failure mode and failure mechanism klystron storage failure residual gas vacuum degree |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2045704 |
专题 | 华南理工大学 |
作者单位 | 1.[1]South China Univ Technol, Sch Electron & informat, Guangzhou 510641, Guangdong, Peoples R China 2.[2]China Elect Produce Reliabil & Environm Testing R, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Guangdong, Peoples R China |
推荐引用方式 GB/T 7714 | Song, Fangfang[1,2],Li, Ruguang[2],Liu, Liyuan[2],等. The Storage Failure Mode and Failure Mechanism Study of High-Power Klystron (CPCI-S收录)[C]. 见:PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论