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	The storage failure mode and failure mechanism study of high-power klystron (EI收录)
	Song, Fangfang[1,2]; Li, Ruguang[2]; Liu, Liyuan[2]; En, Yunfei[2]; Li, Bin[1]
会议名称	ICRMS 2014 - Proceedings of 2014 10th International Conference on Reliability, Maintainability and Safety: More Reliable Products, More Secure Life
会议日期	August 6, 2014 - August 8, 2014
会议地点	Guangzhou, China
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2043836
专题	华南理工大学
作者单位	1.[1] South China University of Technology, School of Electron and Information, Guangzhou, China 2.[2] Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Produce Reliability and Environmental Testing Research Institute, Guangzhou, China
推荐引用方式 GB/T 7714	Song, Fangfang[1,2],Li, Ruguang[2],Liu, Liyuan[2],等. The storage failure mode and failure mechanism study of high-power klystron (EI收录)[C]. 见:ICRMS 2014 - Proceedings of 2014 10th International Conference on Reliability, Maintainability and Safety: More Reliable Products, More Secure Life. Guangzhou, China. August 6, 2014 - August 8, 2014.

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