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	Data analysis method of the small samples and zero-failure data for space TWT accelerated life test (CPCI-S收录)
	Song, Fangfang[1,2]; Zhou, Zhenwei[2]; Li, Shajin[2]; En, Yunfei[2]; Li, Bin[2]
会议名称	2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
关键词	Space traveling wave tube (TWT) accelerated life tests zero-failure data processing
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2043562
专题	华南理工大学
作者单位	1.[1]S China Univ Technol, Sch Elect & Informat, Guangzhou 510641, Guangdong, Peoples R China 2.[2]Elect Produce Reliabil & Environm Testing Res Ins, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Guangdong, Peoples R China
推荐引用方式 GB/T 7714	Song, Fangfang[1,2],Zhou, Zhenwei[2],Li, Shajin[2],等. Data analysis method of the small samples and zero-failure data for space TWT accelerated life test (CPCI-S收录)[C]. 见:2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT).

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